Electromagnetic Behavior of Cu and Ni Nanofilms in the X-band

Authors

  • Vitor Fernando de Melo Gonçalves Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil. https://orcid.org/0009-0008-6898-1200
  • Erick Gabriel Ribeiro dos Anjos Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros –– São José dos Campos/SP – Brazil. https://orcid.org/0000-0001-6443-8448
  • Guilherme Ferreira de Melo Morgado Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil. https://orcid.org/0000-0001-5260-6854
  • Tayra Rodrigues Brazil Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil. https://orcid.org/0000-0001-7003-0975
  • Maurício Ribeiro Baldan Instituto Nacional de Pesquisas Espaciais – Laboratório Associado de Sensores e Materiais – São José dos Campos/SP – Brazil. https://orcid.org/0000-0001-7605-1064
  • Maria Aparecida Miranda de Souza Departamento de Ciência e Tecnologia Aeroespacial – Instituto de Aeronáutica e Espaço – Divisão de Materiais – São José dos Campos/SP – Brazil. https://orcid.org/0000-0001-5027-8332
  • Evandro Luís Nohara Universidade de Taubaté – Departamento de Engenharia Mecânica – Taubaté/SP – Brazil. https://orcid.org/0000-0002-5477-5894
  • Mirabel Cerqueira Rezende Universidade Federal de São Paulo – Instituto de Ciência e Tecnologia – Laboratório de Tecnologia de Polímeros e Biopolímeros – São José dos Campos/SP – Brazil. https://orcid.org/0000-0002-3735-8765

Keywords:

Electromagnetic shielding , Energy absorption films, Thin films, Nickel coatings, Copper, Magnetron sputtering

Abstract

Currently, the presence of spurious microwave radiation is increasing in the environment, which has caused concern due to possible health problems in living beings and electromagnetic interference in electronic systems. To control this problem, studies in the materials area are taking place, aiming to attenuate the spurious radiation and meet requirements of good performance in broadband, low cost and low weight. The present work aimed to study Cu and Ni nanometric films with thicknesses of 65 and 200 nm, deposited on polyethylene terephthalate substrate by magnetron sputtering. Scanning electron microscopy with a field emission gun (FEGSEM) showed that the films produced have different morphological textures, due to the parameters used in the sputtering process and also the free energy of metals. Impedance spectroscopy measurements showed that the films have low conductivity values, due to the metallic oxides formed on the film surfaces, confirmed by X-ray diffraction, and also to the presence of defects. Electromagnetic characterization (8.2 – 12.4 GHz) showed that the Cu and Ni thin films had low performance, except the Ni_200 nm film, which showed a total shielding efficiency of about 30% in broadband. This result is promising considering the nanometric thickness of the Ni film.


Downloads

Published

2023-06-26

Issue

Vol. 15 (2023)

Section

Original Papers

License

Copyright (c) 2023 Vitor Fernando de Melo Gonçalves, Erick Gabriel Ribeiro dos Anjos, Guilherme Ferreira de Melo Morgado, Tayra Rodrigues Brazil, Maurício Ribeiro Baldan, Maria Aparecida Miranda de Souza, Evandro Luís Nohara, Mirabel Cerqueira Rezende

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

This work is licensed under a Creative Commons — Attribution 4.0 International — CC BY 4.0. Authors are free to Share (copy and redistribute the material in any medium or format) and Adapt (remix, transform, and build upon the material for any purpose, even commercially). JATM allow the authors to retain publishing rights without restrictions.